Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.


Author
Publisher BoD – Books on Demand
Release Date
ISBN 1839682299
Pages 275 pages
Rating 4/5 (92 users)

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